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Temperature/Component-Dependent Luminescence in Lead-Free Hybrid Metal Halides for Temperature Sensor and Anti-Counterfeiting
Zhou, G., Wang, Y., Mao, Y., (...), Xia, Z., Zhang, X.-M.// Advanced Functional Materials//
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2024
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Terahertz Spectroscopy of Magnetoelectric HoAl3(BO3)4
Kuzmenko, A.M., Ivanov, V.Y., Tikhanovsky, A.Y., (...), Gudim, I.A., Mukhin, A.A.// Optics and Spectroscopy//
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2024
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Tetragonal to cubic transition of Sr0.8Dy0.2CoO3-delta and oxygen mobility: TG-DSC-XRD study
Vereshchagin, Sergei; Dudnikov, Vyacheslav; Orlov, Yury; Solovyov, Leonid Journal Of Alloys And Compounds. DOI: 10.1016/j.jallcom.2020.158257
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2020
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Texture analysis in watermarking paradigms
Favorskaya, M; Pyataeva, A; Popov, A KNOWLEDGE-BASED AND INTELLIGENT INFORMATION & ENGINEERING SYSTEMS, 112 1460-1469; 10.1016/j.procs.2017.08.019 2017
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2017
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Thallium ionic conductivity of new thallium indium hafnium molybdate ceramics
Victoria G. Grossman, Jibzema G. Bazarova, Maksim S. Molokeev & Bair G. Bazarov. Ionics. DOI https://doi.org/10.1007/s11581-020-03739-7
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2020
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The alternating-sign magnetoresistance of polycrystalline manganese chalcogenide films
Aplesnin, S. S.; Romanova, O. B.; Sitnikov, M. N.; Kretinin, V. V.; Galyas, A., I; Yanushkevich, K., I SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 33 ...
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2018
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The Anisotropic Thermal Expansion of Non-linear Optical Crystal BaAlBO3F2 Below Room Temperature
Jiang, Xingxing; Wang, Naizheng; Molokeev, Maxim S.; Wang, Wei; Guo, Shibin; Huang, Rongjin; Li, Laifeng; Hu, Zhanggui; Lin, Zheshuai Source: FRONTIERS IN ...
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2018
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The arising of ferromagnetism in Al-doped Mn2(Ga1-xAlx)C MAX phases
Zhandun, Vyacheslav S.; Zamkova, Natalia G.; Draganyuk, Oksana N.// JMMM//
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2024
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The Ca2+-Regulated Photoprotein Obelin as a Tool for SELEX Monitoring and DNA Aptamer Affinity Evaluation
Vasilisa V. Krasitskaya Natalia S. Goncharova Vladislav V. Biriukov Eugenia E. Bashmakova Marsel R. Kabilov Ivan K. Baykov Aleksey E. Sokolov Ludmila A. ...
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2020
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The Circulation Radius and Critical Current Density in Type II Superconductors
Gokhfeld, D. M. Source: TECHNICAL PHYSICS LETTERS, 45 (1):1-3; 10.1134/S1063785019010243 JAN 2019
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2019
