Experimental and Theoretical Tools

Laboratory of Magnetic MAX-materials uses and has an access to following experimental facilities.

1. A high-performance magnetron sputtering system for multi-element thin film deposition with in-situ analysis (LEED, AES, MOKE)

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  1. Spectral ellipsometer «Ellips-1991». Measurements modes: reflection at variable angle, transmission, transverse Kerr configuration. Magnetic field is up to 1 T, parallel to the sample plane. Wavelength: 340 -1000 nm. Temperature: 140 K - 300 K. Sample size: width 4(1) mm, length 10(1) mm, thickness: up to 1 mm.

  2. UHV spectral ellipsometer based on the «Ellips-1991». Measurements modes: reflection at fixed angle of 55°, transverse Kerr configuration. Magnetic field is up to 0.6 T, parallel to the sample plane. Temperature: 100 - 1000 K. Sample size: width 8-10 mm, length: 20-30 mm, thickness: up to 1 mm.

  3. Home-built setup for magneto-optical characterisation. Measurements modes: magnetic circular dichroism, magnetic linear dichroism, absorption (linear polarisation), Faraday effect. Temperature: 4.2 - 300 K. Magnetic field is up to 1.2 T at room temperature, up to 0.4 T at temperature down to 90 K, 0.1 T at temperature down to 4.2 K. Wavelength: 300 -1200 nm. Sample size: width 2 – 10 mm, length 2 – 20 mm.

  4. Magneto-optical Kerr effect “NanoMOKE 2”. Measurements modes: transverse and longitudinal Kerr effect. Magnetic field dipole (Hmax = 0.5 T) and Quadrupole (Hmax= 35 mT), parallel to the sample plane Temperature range: 5-300 K. Laser wavelength: 670 nm. Sample size: from 0.2x0.2 mm to 20x20 mm. Sample size restriction for the cryostat: max. 10x10 mm.

  5. Wide-band IR Fourier spectrometer with a helium prefix Vertex 80 (Bruker, Germany, 2010). Measurements modes: transmission, reflection, disturbed reflection, and diffuse, total internal reflection, reflection at a fixed or adjustable angle. Temperature range: 4 - 410 К. Wavelength: 0.4 -50 µm. Temperature-dependent studies are carried out in the transmission mode. Sample size restriction for the cryostat: d = 13 mm (least). Measurements of reflection, disturbed reflection, and diffuse, total internal reflection, reflection at a fixed or adjustable angle are carried out at room temperature.

  6. IR Fourier spectrometer based on Bruker Tensor 27 with Hyperion microscope : Measurements modes: reflection, transmission. Temperature range: 100 - 500 K. Wavelength: 0.4-1μm, 3-16.5 μm. Optionally, a permanent magnet can be adapted for in-field measurements. Sample size: d = 200 µm (least), d = 15 mm (most).

  7. EPR Fourier spectrometer Bruker Elexsys-ii-e580 : EPR/ESR/FMR (X-Band, CW mode), for the study of paramagnetism, magnetic anisotropy of ferromagnets, high-frequency susceptibility, temperature range: 3 K - 400 K. Maximum magnetic field: 1.8 T. Sample size: max length: 4 mm, max width: 5 mm.

  8. Home-built setup with optical combi cryostat (bath + continuous flow) for transport characterization of the samples. Sample size up to 10x10 mm². Temperature range 5 - 300 K; magnetic field up to 1T; Measurement modes: dc and ac (20Hz-2MHz) transport, dielectric properties, magnetocapacitance effect, MR, ac MR, Hall effect, resistivity by van der Pauw method, optical irradiation (980 nm laser).

  9. The Lake Shore CRX-EM-HF probe station : Temperature range: 5 K - 300 K; magnetic field up to 0.6 T in sample plane, sample rotation 360 deg; Measurements modes: dc and ac (20Hz-2MHz) transport, MR, ac MR, resistivity by van der Pauw method.

  10. Physical Property Measurement system, PPMS 6000 (Quantum Design, USA) - The device allows one to study DC magnetization and AC magnetic susceptibility; specific heat capacity; AC / DC resistivity, Hall effect, I-V curves; thermal conductivity, Seebeck coefficient. Temperature range of 5 - 1000 K, magnetic field up to 9 T.: AC susceptibility sensitivity – 2⋅10^-8 emu at 10 kHz; DC sensitivity – 2.5⋅10^-5 emu.

     

  11. Home-built setup for measurement of Seebeck coefficient and DC resistivity. Temperature: 90 K - 800 K. Sample size: length 9-12 mm, width: 3 - 12 mm, thickness: up to 7 mm.

  12. Lake Shore VSM 8604 vibrating sample magnetometer. Temperature range of 4,2 - 1273 K, magnetic field up to 2.3 T at RT, at low temperature and high temperature up to 1.5 T. Dynamic range from 25 × 10-9 to 103 emu.

  13. Hitachi SU3500 Electron microscope equipped with EDX, EBSD, and WDX systems - for microstructure and chemical analysis with nm resolution.

  14. Scanning electron microscope S-5500 (Hitachi, Japan) ultra-high resolution SEM, allows simultaneous secondary electron and backscattered electron imaging using an integrated detector design, permits 3-dimensional morphological observation down to the atomic or molecular structures of various materials.

  15. Transmission electron microscope HT7700 (Hitachi, Japan)-, accelerating voltage 120 kV, equipped with an ED spectrometer 6T/60 (Bruker, Germany).

  16. X - ray diffractometer PANalytical X'pert PRO equipped with a PIXcel solid-state detector.

  17. D8 ADVANCE - powder diffractometer (Cu Calpha1,2-radiation, Ni filter) with a linear VANTEC detector.

  18. NANOINK DPN 5000 Atomic force microscope.

  19. QUANT'X EDXRF Spectrometer - quantitative analysis of chemical composition.

Our laborotary has also an access to the equipment of the Krasnoyarsk Regional Center of Research Equipment of Federal Research Center
“Krasnoyarsk Science Center SB RAS”. The list of equipment is available here.

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