Ghost imaging microscopy: Towards to three dimensional extended depth-of-field imaging

Davletshin, N.N., Vyunishev, A.M., Chirkin, A.S.// Optics and Laser Technology//

https://doi.org/10.1016/j.optlastec.2025.112465

Light-field microscopy techniques inherently suffer from image degradation outside the imaging system’s depth-of-field (DOF). Deviation from the correct imaging system’s focal plane resulted in a loss of resolution and distortion of image details. Here, we present a ghost imaging microscopy which is based on spatial intensity correlations of the light field. Ghost imaging microscopy allows us to overcome the limitations connected with the objective focusing tolerance leading to unprecedented high DOF. The obtained results promote the route to imaging volumetric microscopic structures up to several millimeters long.


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