Magneto-Optical Ellipsometry of Thin Films with Optical Uniaxial Anisotropy

Maximova, O.A., Lyaschenko, S.A., Varnakov, S.N., (...), Shevtsov, D.V., Andryushchenko, T.A.// Physics of Metals and Metallography//

https://doi.org/10.1134/S0031918X23601385

In this paper, we solve the inverse problem of magneto-optical ellipsometry for thin ferromagnetic films with optical uniaxial anisotropy. We work within the framework of the approach we developed earlier analyzing magnetoellipsometric data without using fourth-order M-matrices. We work with ellipsometric relations, in which we take into account the magneto-optical contribution as perturbations, and ellipsometric measurements are carried out on a setup with a simple dipole scheme based on the transverse magneto-optical Kerr effect. We add the magneto-optical response to the expressions known in the literature for the reflection coefficients of anisotropic thin films, which are related to the parameters measured by magneto-optical ellipsometry. As a result, by analyzing the obtained expressions for the reflection coefficients, we obtain information on the total permittivity tensor of a thin film.

 

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