Experimental and Theoretical Tools

1. A high-performance magnetron sputtering system  for multi-element thin film deposition with in-situ analysis (LEED, AES, MOKE)

2. Spectral ellipsometer «Ellips-1991». Measurements modes: reflection at variable angle, transmission, transverse Kerr configuration. Magnetic field is up to 1 T, parallel to the sample plane. Wavelength: 340 -1000 nm. Temperature: 140 K - 300 K. Sample size: width 4(1) mm, length 10(1) mm, thickness: up to 1 mm.
   
   

3. UHV spectral ellipsometer based on the «Ellips-1991». Measurements modes: reflection at fixed angle of 55°, transverse Kerr configuration. Magnetic field is up to 0.6 T, parallel to the sample plane. Temperature: 100 - 1000 K. Sample size: width 8-10 mm, length: 20-30 mm, thickness: up to 1 mm.
   
   

4. Home-built setup for magneto-optical characterisation. Measurements modes: magnetic circular dichroism, magnetic linear dichroism, absorption (linear polarisation), Faraday effect. Temperature: 4.2 - 300 K. Magnetic field is up to 1.2 T at room temperature, up to 0.4 T at temperature down to 90 K, 0.1 T at temperature down to 4.2 K. Wavelength: 300 -1200 nm. Sample size: width 2 – 10 mm, length 2 – 20 mm.
   
   

5. Magneto-optical Kerr effect “NanoMOKE 2”. Measurements modes: transverse and longitudinal Kerr effect. Magnetic field dipole (H_max = 0.5 T) and Quadrupole (H_max= 35 mT), parallel to the sample plane Temperature range: 5-300 K. Laser wavelength: 670 nm. Sample size: from 0.2x0.2 mm to 20x20 mm.   Sample size restriction for the cryostat: max. 10x10 mm.
   
   

6. Wide-band IR Fourier spectrometer with a helium prefix Vertex 80 (Bruker, Germany, 2010). Measurements modes: transmission, reflection, disturbed reflection, and diffuse, total internal reflection, reflection at a fixed or adjustable angle. Temperature range: 4 - 410 К. Wavelength: 0.4 -50 µm. Temperature-dependent studies are carried out in the transmission mode. Sample size restriction for the cryostat: d = 13 mm (least). Measurements of reflection, disturbed reflection, and diffuse, total internal reflection, reflection at a fixed or adjustable angle are carried out at room temperature.
   
   

7. IR Fourier spectrometer based on Bruker Tensor 27 with Hyperion microscope : Measurements modes: reflection, transmission. Temperature range: 100 - 500 K. Wavelength: 0.4-1μm, 3-16.5 μm. Optionally, a permanent magnet can be adapted for in-field measurements. Sample size: d = 200 µm (least), d = 15 mm (most).

8. EPR Fourier spectrometer Bruker Elexsys-ii-e580 : EPR/ESR/FMR (X-Band, CW mode), for the study of paramagnetism, magnetic anisotropy of ferromagnets, high-frequency susceptibility, temperature range: 3 K - 400 K. Maximum magnetic field: 1.8 T. Sample size: max length: 4 mm, max width: 5 mm.
   
   

9. Home-built setup with optical combi cryostat (bath + continuous flow) for transport characterization of the samples. Sample size up to 10x10 mm². Temperature range 5 - 300 K; magnetic field up to 1T; Measurement modes: dc and ac (20Hz-2MHz) transport, dielectric properties, magnetocapacitance effect, MR, ac MR, Hall effect, resistivity by van der Pauw method, optical irradiation (980 nm laser).
   
   

10. The Lake Shore CRX-EM-HF probe station : Temperature range: 5 K - 300 K; magnetic field up to 0.6 T in sample plane, sample rotation 360 deg; Measurements modes: dc and ac (20Hz-2MHz) transport, MR, ac MR, resistivity by van der Pauw method.
    
    
11.  Physical Property Measurement system, PPMS 6000 (Quantum Design, USA) -  The device allows one to study DC magnetization and AC magnetic susceptibility; specific heat capacity; AC / DC resistivity, Hall effect, I-V curves; thermal conductivity, Seebeck coefficient. Temperature range of 5 - 1000 K, magnetic field up to 9 T.: AC susceptibility sensitivity – 2⋅10^-8 emu at 10 kHz; DC sensitivity – 2.5⋅10^-5 emu.
    

     

12. Home-built setup for measurement of Seebeck coefficient and DC resistivity. Temperature: 90 K - 800 K. Sample size: length 9-12 mm, width: 3 - 12 mm, thickness: up to 7 mm.
    
    

13. Lake Shore VSM 8604 vibrating sample magnetometer. Temperature range of 4,2 - 1273 K, magnetic field up to 2.3 T at RT, at low temperature and high temperature up to 1.5 T. Dynamic range from 25 × 10^-9 to 10³ emu.
    
    

14. Hitachi SU3500 Electron microscope equipped with EDX, EBSD, and WDX systems - for  microstructure and chemical analysis with nm resolution.

15. Scanning electron microscope S-5500 (Hitachi, Japan) ultra-high resolution SEM, allows simultaneous secondary electron and backscattered electron imaging using an integrated detector design, permits 3-dimensional morphological observation down to the atomic or molecular structures of various materials.
    
    
16. Transmission electron microscope HT7700 (Hitachi, Japan)-, accelerating voltage 120 kV, equipped with an ED spectrometer 6T/60 (Bruker, Germany).
    
    
17. X - ray diffractometer PANalytical X'pert PRO equipped with a PIXcel solid-state detector.
    
    

18. D8 ADVANCE - powder diffractometer (Cu Calpha1,2-radiation, Ni filter) with a linear VANTEC detector.
    
    

19.  NANOINK DPN 5000 Atomic force microscope.
    
    

20. QUANT'X EDXRF Spectrometer - quantitative analysis of chemical composition.