Experimental and Theoretical Tools

1. A high-performance magnetron sputtering system for the MAX-phase synthesis with integrated means for determining physical properties

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  1. Spectral ellipsometer LEF-32M, equipped with an electromagnet (from -1.5 T to 1.5 T) - study of optical and magneto-optical properties of the obtained samples.
  2. Installation of the magneto-optical Kerr effect NanoMOKE 2, with the possibility of studying the field dependencies of the Kerr effect in a wide temperature range (2-300 K) - the study of magnetic anisotropy in the substrate plane.
  3. Hitachi SU3500 / Model SU3500 Electron microscope equipped with EDX, EBSD, and WDX systems - conducting local phase and chemical analysis of hybrid nanocrystals.
  4. Scanning electron microscope of ultra-high resolution S-5500 (Hitachi, Japan, - investigation of morphology of obtained samples.
  5. Transmission electron microscope HT7700 (Hitachi, Japan) - the study of the interface structure of the obtained nanostructures with light-field microscopy, dark-field microscopy, high-resolution electron microscopy, accelerating voltage 120 kV, equipped with an ED spectrometer 6T/60 (Bruker, Germany).
  6. Installation of research of physical properties of materials: PPMS 6000 (Quantum Design, USA) - measurement of temperature dependences of the magnetisation of the obtained samples.
  7. the epitaxial relations of layers and substrates, as well as the phase analysis of nanostructures are studied using the capabilities of the PANalytical X'pert PRO, X - ray diffractometer equipped with a PIXcel solid-state detector and the D8 ADVANCE powder diffractometer (Cu Calpha1,2-radiation, Ni filter) with a linear VANTEC detector.
  8. NANOINK DPN 5000 Atomic force microscope. Atomic force microscopy measurements.
  9. X-ray Fluorescence spectrometer Pioneer S4 (Bruker, Germany) - quantitative macroscopic analysis of the chemical composition of the samples obtained.
  10. EPR Fourier spectrometer Bruker Elexsys E580-registration of EPR spectra in pulsed and continuous modes, for the study of paramagnetic centres of various nature, determination of their spectral characteristics and content.
  11. Wide-band IR Fourier spectrometer with a helium prefix Vertex 80 (Bruker, Germany, 2010) - the spectrometer is designed to measure the transmission, absorption, reflection, disturbed reflection, diffuse, total internal reflection, reflection at a fixed or adjustable angle.
  12. Original author's method based on the method of laser ellipsometry calculation of the effective thickness of growing nanostructures and optical characteristics [Tarasov, I. A. Ellipsometric Express method for determining the thickness and profiles of optical constants in the process of growth of Fe/SiO2/Si(100) nanostructures / I. A. Tarasov, N. N. Kosyrev, S. N. Varnakov, S. G. Ovchinnikov, S. M. Zharkov, V. A. Shvets, S. G. Bondarenko, O. E. Tereshchenko // ZhTF.-2012. – vol. 82. – p. 44].
  13. Original author's method for calculating magneto-optical parameters and non – diagonal components of the permittivity tensor [Maximova, O. A. in situ magneto – optical ellipsometry data analysis for films growth control / O. A. Maximova, N. N. Kosyrev, S. N. Varnakov, S. A. Lyaschenko, I. A. Yakovlev, I. A. Tarasov, D. V. Shevtsov, O. M. Maximova, S. G. Ovchinnikov // journal of magnetism and magnetic materials. - 2017. - in press DOI: 10.1016/J.jmmm.2016.12.050].