The Magneto-Optical Voigt Parameter from Magneto-Optical Ellipsometry Data for Multilayer Samples with Single Ferromagnetic Layer

Maximova, O.; Lyaschenko, S.; Tarasov, I; Yakovlev, I; Mikhlin, Y.; et al. // Physics Of The Solid State/

https://link.springer.com/article/10.1134%2FS1063783421090274

Calculations of the magneto-optical Voigt parameter Q were carried out using various models of reflecting media for thin films Fe|SiO2|Si(100) samples using the data of the in situ magneto-ellipsometry. The obtained spectral dependences of Q make it possible to choose the algorithm for the analysis of experimental magneto-ellipsometry data and demonstrate that magneto-optical parameter Q of iron is thickness-dependent.


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