In Situ Electron Diffraction and Resistivity Characterization of Solid State Reaction Process in Cu/Al Bilayer Thin Films
Moiseenko, Evgeny T.; Altunin, Roman R.; Zharkov, Sergey M. METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE DOI: 10.1007/s11661-019-05602-5
http://kirensky.ru/en/publications/2020/in-situ-electron-diffraction-and-resistivity-characterization-of-solid-state-reaction-process-in-cu-al-bilayer-thin-films
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In Situ Electron Diffraction and Resistivity Characterization of Solid State Reaction Process in Cu/Al Bilayer Thin Films
Moiseenko, Evgeny T.; Altunin, Roman R.; Zharkov, Sergey M. METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE DOI: 10.1007/s11661-019-05602-5
