In Situ Electron Diffraction and Resistivity Characterization of Solid State Reaction Process in Cu/Al Bilayer Thin Films

Moiseenko, Evgeny T.; Altunin, Roman R.; Zharkov, Sergey M. METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE DOI: 10.1007/s11661-019-05602-5